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K&L Microwave发布4G-LTE频段互调杂散测试的滤波器解决方案 |
| 主讲公司：美国都福陶瓷微波产品有限公司 - K&L Microwave |
| 题目（中/英文）：4G-LTE频段互调杂散测试的滤波器解决方案 （K&L Microwave） |
| Filtering Modules for IMD Measurements over 4G‐LTE Bands (K&L Microwave) |
| 主讲人：毛阳明 职务：亚洲区市场经理 |
| 会议内容： |
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在测试LTE 3G和4G器件的IMD，IP3和Triple beat时，业界传统上往往使用滤波器、衰减器、合路器来搭建测试系统，将测试信号进行混合，并确保进入频谱仪的信号功率在可以接受的水平。然而，由于使用了衰减器，系统的动态范围被缩减，从而带来不可靠的测试结果。此外，由于被测器件产生的信号反射或者系统混合信号的反射，测试系统的测试性能会被进一步被削弱。本次演讲将探讨几个创新的滤波解决方案，这些方案可以减少或移除衰减器的使用，并增加系统整体的回波损耗，进而大大提升测试系统的动态范围。 |
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Traditional test setups for IMD, IP3, and triple beat testing of LTE 3G and 4G components use a combination of filters, attenuators and hybrid combiners to combine signals while keeping power inputs to spectrum analyzers to acceptable levels. The use of attenuators, specifically, reduces the dynamic range of the spectrum analyzer thereby making the tests less reliable. Reflections caused either by the device under test or mixing of signals in the test setup further degrades the systems test performance. This presentation will discuss several innovative filtering solutions to minimize, or eliminate, the use of attenuators while increasing the systems overall return loss. Together these approaches significantly increase the dynamic range of any test setup. |
